MIRA3 FE-SEM Microscope
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Description

The MIRA3 configurations include LM, XM and GM chamber sizes with optimised geometry capable of both low and high vacuum operations.

Features:

- High Brightness Schottky emitter for imaging in

              High Resolution

              High Current

              Low Noise modes.

- Unique "Wide Field Optics" design with a proprietary Intermediate Lens (IML) offering a different kind of working and displaying modes, for enhanced field of view or depth of focus.

- Real-time "In-Flight Beam Tracing" for performance and optimization of beam, that also allows direct and continuous control of the beam and beam current "Beam Deceleration Technology" (BDT) for excellent resolution at low beam voltages.

- Powerful "In-Beam detector" provides Excellent imaging at short working distances.  (optional).

- All MIRA3 chambers using a 5-axis fully motorized Compucentric Stage that provide superior specimen handling and have ideal geometry for EDX and EBSD.

- Extra-large chambers (XM, GM) with robust stages able to accommodate large samples including large wafers (15, 20, 30 Cm) (Optional).

- Numerous interface ports with optimized analytical geometry for attaching EDX, WDX and EBSD detectors.

- Many variable pressure modes for investigation of non-conductive samples.

- Several suspension type for chamber to ensure effective reduction of ambient vibrations in the laboratory.

Attributes

LM Chamber

Internal size 230mm
Door 148mm
(width)
Number of ports 11
Type Compucentric
Maximum specimen height (54mm (Rotation Stage
(81mm (Without Rotation Stage

XM hamber

Internal size 290mm * 340mm
W * D
Door 290mm * 322mm
W * H
Number of ports 12
Type Compucentric
Maximum specimen height (106mm (Rotation Stage
(147mm (Without Rotation Stage

GM Chamber

Internal size 340mm * 315mm
W * D
Door 340mm * 320mm
W * H
Number of ports 20
Type Compucentric
Maximum specimen height (106mm (Rotation Stage
(147mm (Without Rotation Stage

Detectors

SE Yes
In-Beam SE Option
STEM Option
In-Beam LE-BSE Option
LE-BSE Option
LVSTD Depend On Chamber Size Optional
EDX Option
WDX Option
EBSD Option
CL Option
EBIC Option

Accessories

PA Meter Yes
Touch Alarm Yes
IR TV Camera Yes
Peltier Cooling Stage Option
Control Panel Option
Beam Blanker for SEM Column Option
Load Lock Option
Nanomanipulators Option
Plasma Cleaner Option
Active Vibration Isolation Depend On Chamber Size Optional
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