TIMA-X is a fast automated quantitative analysis system for mineralogy (such as rocks, ores, concentrates, tailings, leach residues or smelter products).
It combines BSE and EDX analysis to identify minerals and create mineral images to determine mineral concentrations, element distributions, and mineral texture properties (such as grain-size, association, liberation and …). It can also search for bright phases Like platinum group, gold, silver, rare earth and other minerals.
TIMA-X to increase performance and reliability uses up to four EDAX Element silicon drift detectors and new software. These detectors are designed to increase sensitivity to light elements and maintain stable energy resolution at very high-count rates. New software has unique features such as a new generation of mineral identification tools and low element detection limits using its patented pixel analysis algorithms.
TIMA-X can be fitted with the AutoLoader (a robotic sample loading system for 24/7 unattended measurement of up to 100 epoxy block) for high-throughput applications.
Unique Features:
- Schottky Field Emission
- Four integrated EDX detectors for maximum performance
- Latest generation of Peltier-cooled SDD detectors
- New 30 mm2 SDD CMOS vacuum encapsulated chip
- Si3N4 ceramic window is rugged, non-porous and has high transmissivity
- AutoLoader for continuous and unattended automated operations
- Summing of low-count spectra for lower detection limits
- Direct quantitative EDX analysis of TIMA measured X-ray spectra