Explorer is a multi purpose - Theta/Theta - high resolution diffractometer which, because of its direct drive torque motors, offers top performances in many analytical areas such as phase analysis, determination of microstructural properties on bulk or thin film materials.
There is a wide range of accessories and attachments available for EXPLORER that allows to perform measurement in different configurations: traditional X-Ray Powder Diffraction (XPD), Reflectometry (XRR), Grazing Incidence X-Ray Diffraction (GIXRD), High Resolution X-Ray Diffraction (HRXRD), Total X-Ray Fluorescence (TXRF), Residual Stress and Texture X-Ray Diffraction.
The modularity and the flexibility of Explorer allows to start with an entry-level system then upgrade to meet new requirements.
Application and key features:
- Routine Cystalline phase identification and quantification
- Crystallite size - lattice strain and crystallinity calculation
- Polymorph screening and crystal structure analysis
- Residual Stress and Retained Austenite Quantification
- Thin Films, Depth Profiling and non-ambient analysis
- Phase Transition monitorin, tecture and preferred orientations
- Characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).
- Realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.